ZEISS introduced the Crossbeam 750, a focused ion beam-scanning electron microscope (FIB-SEM) that allows live, high-resolution imaging during sample milling. This technology enables real-time feedback to improve precision in semiconductor device analysis and materials research, reducing rework and enhancing yield. The system supports advanced workflows like 3D tomography and nanofabrication with superior resolution and a large undistorted field of view. Available now, it aims to advance semiconductor manufacturing and scientific discovery through improved sample preparation and imaging capabilities.
The global automotive microcontrollers market is projected to grow from USD 15.49 billion in 2025 to USD 34.31 billion by 2035, at a CAGR of 8.28%. Growth is fueled by increasing adoption of advanced driver-assistance systems (ADAS), vehicle electrif...
Sodexo has secured a major global contract to provide catering services across more than 130 Meta sites in over 30 countries. This large-scale partnership includes diverse locations such as headquarters, campuses, data centers, and conference centers...
Solana (SOL) has gained about 30% from its June low, trading around $78 and surpassing its 50-day EMA. The token's upward momentum is supported by increased speculative trading and a new SuperTrend buy signal, the first since October 2025. However, i...
Kenmare Resources reported weaker-than-expected production in the first half of 2026 due to commissioning delays at its Wet Concentrator Plant A, with ilmenite output down 40% year on year in Q2. Despite this, shipments increased by 53% as the compan...
Ramsdens Holdings PLC shares rose 13.6% to 670p following an improved takeover offer from US pawnbroking group FirstCash. FirstCash increased its cash bid to 675p per share from 600p, raising the total offer value to up to £232 million, including div...
